Material Science
Extreme Scale Analytics and Simulation for Material Science
This WP focuses on extreme scale analytics and simulation for materials science. This WP has two projects that are related. This WP aims to reduce the number of iterations in electronic structure calculations and to focus on the processing of large electronic microscopy images.
The first project, called iGUESS (Intelligent GUess for Electronic Structure Simulations), will construct a set of optimized basis functions for density functional theory (DFT) simulations and of an optimal initial density to be used in a self-consistency cycle. The team will investigate the possibility to use methods of data analytics and machine learning to achieve a significant performance boost of extreme scale ab-initio simulations in materials science.
The second project, called DATA EXPRESS, focuses on live processing data coming from mainly in-situ transmission electron microscope (TEM) experiments. These advanced TEMs have multiple detectors, which can acquire GBs of data in seconds. Currently, it is often only possible to see if the in-situ experiments were successful during post processing. For that reason, live processing requires a combination of scalable architecture and suitable implementations of algorithms for TEM applications. This project will allow the small changes in device structure to be revealed in real time and as such improve the control and success of these complicated in-situ experiments. The LiberTEM open-source software platform for data logistics and distributed processing is developed for this application and can be a basis for developments in DATA EXPRESS.
Team for Material Science
David Cooper
Research Scientist
David Cooper
Matthew Bryan
Research Software Engineer
Matthew Bryan
Vita Mergner
PhD candidate
Vita Mergner
Keyan Ji
PhD candidate
Keyan Ji
Rafal Dunin-Borkowski
Institute Director
Rafal Dunin-Borkowski
Dieter Weber
Group leader Software and Data for Electron Microscopy
Dieter Weber
Alexander Clausen
Research Software Engineer